更新時(shí)間：2024-01-11
廠商性質(zhì)：生產(chǎn)廠家
訪問(wèn)次數(shù)：1800
簡(jiǎn)要描述：Dynamic Bending Tester
ynamic Bending Tester
The Dynamic Bending Tester is designed to simultaneously test 5 cards in accordance with ISO 10373-1. IC cards are expected to remain functional after a total of 2000 bending cycles – and 4000 cycles without breaking apart. The P-13 can also be set to any user defined number of cycles. Automatically stops test once number of test cycles selected is reached.
·Power: 110-220V 50-60Hz.
·Standard Ref: ISO 7810, 10373-1
·CQM Test Ref: P-13
·Test Method: CQM 10.3.13
· CQM §: 5.1.13, 6.1.11 16.1.18.1
Skype：yhcksh :
Ms Yang Web：
上海恒馭儀器有限公司
地址：上海.松江區(qū).泗涇鎮(zhèn)
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